Join us in Ontario, NY!
Registration for this workshop is free, but seating is limited.
Reserve your seat today!
Learn from world leaders in optical metrology.
At this informative workshop hosted by OptiPro Systems, we will have a keynote presentation from 4D Technology’s Dr. Michael North Morris and live demonstrations. Our workshop will also include guest speaker Mitchell Sedore from OptiPro. See you there!
Theory and Practical Aspects of Dynamic Interferometry
for 3D Shape, Transmitted Wavefront Measurements, and Optical System Alignment
- What it is, how it works
- Unique capabilities using dynamic interferometry
- When to use a Fizeau versus Twyman-Green interferometer
- What is ITF and why does it matter in detecting mid-spatial frequencies and other manufacturing artifacts
Applications of Dynamic Interferometry
- Ground and space-based telescopes
- Optics shop measurements
- Improved interferometric configurations for superior testing of IR components and systems
- Short-coherence dynamic interferometry to enable measurement of thin and plane-parallel optics
- Supersmooth measurements
- Radius of curvature measurements
- Portable surface roughness measurements
- 3D optical inspection system for defect, chamfer and edge break analysis
Automating Metrology & Inspection
- OptiPro capabilities/products
- Automation in inspection and production
- Identifying Automation Opportunities
Hands-On Experience with Dynamic Interferometers
- PhaseCam: Our highest performance Twyman-green interferometer, with patented, vibration-insensitive measurement capability for concave and long cavity measurements.
- AccuFiz Duo: New! Two laser sources which enables both short coherence on axis dynamic and long coherence phase shifting interferometry for measuring thin, transparent optics or digital hologram measurements all in one system.
- NanoCam: A small, non-contact optical profiler for vibration-immune roughness measurement that can be handheld or mounted on a robot.
- InSpec: A handheld, precision instrument for non-contact surface feature and defect measurement with um-level resolution.
- InSpec SR: A handheld 3D surface roughness system with nm-level resolution.
Plus, we’ll be demonstrating automated solutions, and the latest functionality of 4Sight Focus, including real-time Zernike alignment, advanced island leveling of mirrors and telescope optics, and geometric transforms; and previewing our next release with new fiducial capabilities, aspheric Zernike functionality and more.
Register for the workshop today!
Workshop Details
Topic: Dynamic Interferometry for Metrology with live demonstrations
Presenters:
4D Technology: Dr. Michael North Morris, Senior Director, Product Development
OptiPro Systems: Mitchell Sedore
Location:
OptiPro Systems
6368 Dean Parkway | Ontario, NY 14519
Time: 9:00 AM – 4:00 PM EST | Tuesday, July 15 | Lunch provided
Cost: As a professional in metrology, the event is free to you, but early registration is recommended as seating is very limited.